Non-planar transistors and methods of fabrication thereof

ABSTRACT

Non-planar transistors and methods of fabrication thereof are described. In an embodiment, a method of forming a non-planar transistor includes forming a channel region on a first portion of a semiconductor fin, the semiconductor fin having a top surface and sidewalls. A gate electrode is formed over the channel region of the semiconductor fin, and an in-situ doped semiconductor layer is grown on the top surface and the sidewalls of the semiconductor fin on opposing sides of the gate electrode using a selective epitaxial growth process. At least a part of the doped semiconductor layer is converted to form a dopant rich region.

This application is a divisional of U.S. application Ser. No.12/652,947, entitled “Non-Planar Transistors and Method of FabricationThereof,” filed on Jan. 6, 2010, which claims the benefit of U.S.Provisional Application No. 61/173,809, entitled “Non-Planar Transistorsand Methods of Fabrication Thereof,” filed on Apr. 29, 2009, both ofwhich applications are incorporated herein by reference.

TECHNICAL FIELD

The present invention relates generally to transistors and, moreparticularly, to non-planar transistors and methods of fabricationthereof.

BACKGROUND

Semiconductor devices are used in a large number of electronic devices,such as computers, cell phones, and others. Semiconductor devicescomprise integrated circuits that are formed on semiconductor wafers bydepositing many types of thin films of material over the semiconductorwafers, and patterning the thin films of material to form the integratedcircuits. Integrated circuits include field-effect transistors (FETs),such as metal oxide semiconductor (MOS) transistors.

One of the goals of the semiconductor industry is to continue shrinkingthe size and increasing the speed of individual FETs. To achieve thesegoals, three dimensional (3-D) or non-planar transistor structures suchas fin FETs (FINFETs), multiple gate transistors, or gate all aroundtransistors are being investigated for use in sub 22 nm transistornodes. Such transistors not only improve areal density, but also improvegate control of the channel.

However, fabrication of these non-planar FETs is complex and requiresovercoming a number of challenging problems. One of the challenges isforming metal semiconductor contacts with low contact resistance. As atleast one of the source or the drain contacts is composed partially orfully of a metal silicide, the Schottky barrier height between thesource/drain region and the metal silicide needs to be reduced. A methodof reducing the Schottky barrier height involves increasing the dopinglevel of the surface of the semiconductor being contacted. Traditionalmethods of doping the semiconductor involve implanting dopants into thesurface of the semiconductor during or after source/drain implantation.Unlike planar structures, however, such implantation into non-planarstructures does not produce uniform surface or near surfaceconcentrations. Further, in non-planar structures, implantation leavesresidual defects that may result in poor silicide formation or result inleakage currents.

Accordingly, what is needed in the art are structures and methods offabrication thereof withlow resistance contacts for non-planarsemiconductor structures.

BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding of the present invention, and theadvantages thereof, reference is now made to the following descriptionstaken in conjunction with the accompanying drawing, in which:

FIG. 1, which includes FIGS. 1a-1d , illustrates a non-planar Schottkysource/drain transistor in accordance with an embodiment of theinvention, wherein FIG. 1a illustrates a top view, and wherein FIGS.1b-1d illustrate cross sectional views;

FIG. 2, which includes FIGS. 2a-2d , illustrates a non-planar transistorin accordance with an embodiment of the invention, wherein FIG. 2aillustrates a top view, and wherein FIGS. 2b-2d illustrate crosssectional views;

FIG. 3, which includes FIGS. 3a-3d , illustrates a gate all aroundtransistor in accordance with an embodiment of the invention, whereinFIG. 3a illustrates a top view, and wherein FIGS. 3b-3d illustrate crosssectional views;

FIG. 4, which includes FIGS. 4a-4e , illustrate various stages offabrication of a non-planar structure in accordance with embodiments ofthe invention, wherein FIG. 4a illustrates a perspective view of a fin(non-planar structure), and FIGS. 4b-4e illustrate cross sectional viewsof the fin;

FIGS. 5-8, 9 a, 10, 11 a, and 11 c illustrate a non-planar transistor invarious stages of fabrication in accordance with embodiments of theinvention, and FIGS. 9b and 11b illustrate dopant profiles around asilicide region during the fabrication;

FIGS. 12a and 12c illustrate a non-planar Schottky source/draintransistor during fabrication in accordance with an embodiment of theinvention and FIG. 12b illustrates dopant profiles around a silicideregion during the fabrication; and

FIGS. 13-16 illustrate a non-planar transistor in various stages offabrication in accordance with an embodiment of the invention.

Corresponding numerals and symbols in the different figures generallyrefer to corresponding parts unless otherwise indicated. The figures aredrawn to clearly illustrate the relevant aspects of the embodiments andare not necessarily drawn to scale.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

The making and using of the embodiments are discussed in detail below.It should be appreciated, however, that the present invention providesmany applicable inventive concepts that can be embodied in a widevariety of specific contexts. The specific embodiments discussed aremerely illustrative of specific ways to make and use the invention, anddo not limit the scope of the invention.

The present invention will be described with respect to embodiments in aspecific context, namely a non-planar field effect transistor. Theinvention may also be applied, however, to other devices and structures.As discussed in greater detail below, various embodiments of the presentinvention overcome the limitations discussed above by using an epitaxialprocess. The use of epitaxial process prevents nucleation of residualdefects. Further, a uniformly controlled doping is achievable even innon-planar structures.

A structural embodiment of a non-planar transistor with low Schottkybarrier height will be described with reference to FIG. 1. Furtherstructural embodiments are described below with respect to FIGS. 2 and3. A method of reducing the Schottky barrier height between the metalcontact and a non-planar semiconductor structure will be described withreference to FIG. 4. A method of forming non-planar transistors will bedescribed with reference to FIGS. 5-11 in accordance with an embodimentof the invention. Alternative embodiments of fabrication will bedescribed with reference to FIG. 12, and FIGS. 13-16.

FIG. 1, which includes FIGS. 1a-1d , illustrates a non-planar transistorin accordance with an embodiment of the invention. FIG. 1a illustrates atop view, whereas FIGS. 1b-1d illustrate cross sectional views takenalong the respective lines of FIG. 1 a.

Referring to FIG. 1a , a transistor 100 includes a fin 28 separated byisolation regions 22. A gate electrode 42 is disposed over the fin 28.The fin 28 is covered with a metal silicide layer 59, which is disposedon either side of the gate electrode 42, and may be disposed under thespacers 36 and/or gate electrode 42 in some embodiments. FIG. 1a alsoillustrates the source/drain regions 39 of the transistor 100. A contact(not shown) is disposed on the metal silicide layer 59.

FIG. 1b illustrates a cross sectional view of the transistor 100 takenalong the line 1 b-1 b of FIG. 1a . The fin 28, disposed between theisolation regions 22, is a continuous piece of underlying semiconductorsubstrate 20. In some embodiments, the fin 28 may be separated from thesubstrate 20 by an insulation layer (not shown). The fin 28 is coveredby a dopant rich region 56, and the metal silicide layer 59 is disposedover the dopant rich region 56. In various embodiments, the metalsilicide layer 59 is separated from the fin 28 by the dopant rich region56 of about a constant thickness. In various embodiments, the thicknessof the dopant rich region 56 is about 0.5 nm to about 10 nm.

Referring to the cross sectional view of FIG. 1c (which is taken alongthe line 1 c-1 c of FIG. 1a ), the gate electrode layer 42 is disposedover a gate dielectric 40. If the thickness of the gate dielectric 40 isuniform on all the surfaces of the fin 28, a triple gate transistor isformed. The channel 11 of the triple gate transistor is disposed underthe gate electrode 42 on a top surface and sidewalls of the fin 28.However, in some embodiments, an additional dielectric layer may beformed over a top surface of the fin 28 before or after forming the gatedielectric 40. Hence, the top surface of the fin 28 is separated fromthe gate electrode layer 42 by a thicker gate dielectric (gatedielectric 40 and the additional dielectric layer), while the sidewallsof the fin 28 are separated by the gate dielectric 40. Consequently, insuch embodiments, the channel 11 of the transistor is formed only alongthe sidewalls of the fin 28, forming a double gate transistor.

FIG. 1d illustrates a cross section of the transistor 100 of the fin 28along the direction of current flow in the channel and illustrates thesource/drain regions 39 disposed within the fin 28 as indicated by theline 1 d-1 d in FIG. 1a . Unlike conventional transistors, thesource/drain regions 39 comprise the metal silicide layer 59. In variousembodiments, the thickness of the metal silicide layer 59 under thespacers 36 is less than about 20 nm, e.g., about 10 nm. In variousembodiments, the metal silicide layer 59 extends under the gateelectrode 42 and gate dielectric 40 by a small distance to minimizeoverlap resistance between the source/drain regions 39 and the channel11 of the transistor 100. In various embodiments, the metal silicidelayer 59 extends less than about 5 nm under the gate electrode 42. Insome embodiments, only the dopant rich region 56 extends under the gateelectrode 42. In various embodiments, the source/drain regions 39adjacent the gate electrode 42 comprise a depth less than about 15 nminto the substrate 20.

In various embodiments, the metal silicide layer 59 has a Schottkybarrier with the channel 11. The Schottky barrier height between thedopant rich region 56 and the metal silicide layer 59 determines thesource/drain series resistance of the transistor. A low Schottky barrierheight is required to reduce this series resistance, but also to preventmultiple turn on in sub-threshold operation. In various embodiments, thedopant rich region 56 is heavily doped so as to minimize thisresistance.

In an embodiment, the dopant rich region 56 is doped to a concentrationgreater than about 1×10¹⁸ cm⁻³, and greater than about 5×10¹⁹ cm inanother embodiment. For example, if a NMOS transistor is beingfabricated the dopant rich region 56 comprises an n-type dopant such asarsenic, antimony and/or phosphorus. Alternatively, if a PMOS transistoris being fabricated, the dopant rich region 56 comprises a p-type dopantsuch as boron and/or indium.

The metal silicide layer 59 comprises a suitable metal silicide to lowerthe Schottky barrier height of the majority carriers. For example, ifthe non-planar transistor comprises a PMOS transistor, the metalsilicide layer 59 is selected to have a vacuum work function greaterthan about 4.6 eV, and greater than about 5.0 eV. In variousembodiments, the metal silicide layer 59 for a PMOS transistor comprisesnickel, platinum, palladium, and/or cobalt. In various embodiments, theSchottky barrier height for holes from the metal silicide layer 59 intothe channel 11 is less than 0.2 eV for a PMOS transistor.

In contrast, if the non-planar transistor comprises a NMOS transistor,the metal silicide layer 59 is selected to have a vacuum work functionless than about 4.6 eV, and less than about 4.0 eV. In variousembodiments, the metal silicide layer 59 for a NMOS transistor comprisesnickel, aluminum, and/or lanthanoids. In an embodiment, the metalsilicide layer 59 for a NMOS transistor comprises nickel doped withlanthanoids such as La, Er, Y, Yb, Dy, Gd, Ce, Tb, Pr and/or Er. In analternative embodiment, the metal silicide layer 59 for a NMOStransistor comprises a nickel aluminide disilicide (NiSi₂Al_(x)). Invarious embodiments, the Schottky barrier height for electrons from themetal silicide layer 59 into the channel 11 is less than 0.2 eV for aNMOS transistor.

In various embodiments, the low Schottky barrier height at the source ofthe transistor and the ultra-shallow junction depths (depth ofsource/drain regions 39) achievable with metal silicides significantlyimproving short channel effects of the transistor, a serious limitationin scaling traditional transistors.

FIG. 2, which includes FIGS. 2a-2d , illustrates a non-planar transistor200 in accordance with another embodiment of the invention. FIG. 2aillustrates a top view, whereas FIGS. 2b-2d illustrate cross sectionalviews. This embodiment is similar to the prior embodiment in forming theSchottky contact to reduce contact resistance. However, unlike the priorembodiment, source/drain regions 39 (see e.g., FIG. 2d ) are formed asin conventional transistors.

The views along FIGS. 2a and 2c are similar to that shown in FIGS. 1aand 1c respectively, and are not described in detail. FIG. 2billustrates a view taken along the line 2 b-2 b of FIG. 2a , FIG. 2cillustrates a view taken along the line 2 c-2 c of FIG. 2a , and FIG. 2dtaken along the line 2 d-2 d of FIG. 2a . Referring to FIGS. 2b and 2d ,a source/drain regions 39 is disposed within the fins 28. A dopedsemiconductor layer 55 is disposed over the source/drain regions 39.While a separate raised source/drain region is not illustrated, invarious embodiments, the doped semiconductor layer 55 may be formed asor over a raised source/drain region, and disposed over the source/drainregions 39. A metal silicide layer 59 is disposed over the dopedsemiconductor layer 55 along the top surface and sidewalls of the fin28. Further, as shown in FIGS. 2a and 2d , the metal silicide layer 59does not extend under the gate electrode 42.

The metal silicide layer 59 comprises a suitable metal silicide to lowerthe Schottky barrier height of the majority carriers. The metal silicidelayer 59 is selected as described above in the prior embodiment. Hence,in various embodiments, the metal silicide layer 59 for forming NMOS andPMOS transistors may comprise different metals. The Schottky barrierheight between the doped semiconductor layer 55 and the metal silicidelayer 59 determines the source/drain series resistance of thetransistor. In various embodiments, the doped semiconductor layer 55 isheavily doped so as to minimize this resistance. In an embodiment, thedoped semiconductor layer 55 is doped to a concentration greater thanabout 1×10¹⁸ cm ⁻³, and greater than about 5×10¹⁹ cm⁻³ in anotherembodiment. For example, if a NMOS transistor is being fabricated thedoped semiconductor layer 55 comprises an n-type dopant such as arsenic,antimony and/or phosphorus. Alternatively, if a PMOS transistor is beingfabricated the doped semiconductor layer 55 comprises a p-type dopantsuch as boron and/or indium.

FIG. 3, which includes FIGS. 3a-3d , illustrates a gate all aroundtransistor 300 in accordance with an embodiment of the invention. FIG.3a illustrates a top view, whereas FIGS. 3b-3d illustrate crosssectional views.

Referring to FIG. 3a , a fin 28 of a transistor 300 is disposed over asubstrate 20 (see FIG. 3b ), and separated by isolation regions 22. Thesubstrate 20 is a semiconductor-on-insulator in an embodiment. A gateelectrode 42 is disposed over the fin 28, which is covered with a metalsilicide layer 59, which is disposed on either side of the gateelectrode 42. Sidewalls of the gate electrode 42 are isolated by spacers36. A contact (not shown) is disposed on the metal silicide layer 59.

FIG. 3b illustrates a cross sectional view of the transistor 300 takenalong the line 3 b-3 b of FIG. 3a . A portion of the fin 28 forming thesource/drain region 39 is covered by a dopant rich region 56, and themetal silicide layer 59 is disposed over the dopant rich region 56. Invarious embodiments, the metal silicide layer 59 is separated from thefin 28 by the dopant rich region 56 of about a constant thickness.

FIG. 3c illustrates a cross sectional view of the transistor 300 takenalong the line 3 c-3 c of FIG. 3a . Unlike the prior embodiment, thegate electrode layer 42 surrounds the fin 28 from all directions. As inprior embodiment, a gate dielectric 40 is disposed on the fin 28 and thegate electrode layer 42 is disposed on the gate dielectric 40. Hence, aninversion layer of the channel is formed within the fin 28. As thediameter of the fin 28 is reduced, all the fin 28 under the gateelectrode 42 may be inverted (volume inversion). While the fin 28 isillustrated as a cuboid, in various embodiments a cylindrical shape maybe used. In an embodiment, the fin 28 may comprise nano-wires. FIG. 3dis a cross sectional view of the transistor 300 taken along the line 3d-3 d of FIG. 3a . FIG. 3d illustrates a cross section of the fin 28along the current flow direction and illustrates the source/drainregions 39 disposed within the fin 28.

FIG. 4, which includes FIGS. 4a-4e , illustrate various stages offabrication of a Schottky contact to a non-planar structure inaccordance with embodiments of the invention, wherein FIG. 4aillustrates a perspective view of a fin 28, and FIGS. 4b-4e illustratecross sectional views of the fin 28 taken along the respective linesshown in FIG. 4a during various stages of fabrication.

FIG. 4a illustrates a fin 28 forming the non-planar structure. Referringto FIG. 4b , using a selective epitaxial growth process, a layer ofsemiconductor material 51 is grown. The growth proceeds in both lateraland vertical directions, for example, at different rates on differentcrystal planes. In an embodiment, semiconductor material 51 is anintrinsic semiconductor. The semiconductor material 51 may be furtherdoped by implantation and annealing. In various embodiments, thesemiconductor material 51 comprises SiGe, SiC, Si or combinationsthereof.

Referring to FIG. 4c , another selective epitaxial growth is used toform a doped semiconductor layer 55. The process conditions within theepitaxial process are controlled to form a doped semiconductor layer 55of a uniform thickness. In an embodiment, a doped semiconductor layer 55comprising a vertical thickness T₅₅ and a lateral thickness L₅₅ isdeposited. In various embodiments, the vertical thickness T₅₅ and thelateral thickness L₅₅ are about the same. In various embodiments, thevertical thickness T₅₅ and the lateral thickness L₅₅ are about 5 nm toabout 50 nm, and about 15 nm in an embodiment. The doped semiconductorlayer 55 may be doped (e.g., in-situ doped) with a p-type dopant if aPMOS transistor is being fabricated. Alternatively, if an NMOStransistor is being fabricated, the doped semiconductor layer 55 isdoped with an n-type dopant.

Referring to FIG. 4d , a silicide metal 57 is deposited. The silicidemetal 57 comprises Ni, Pd, Pt, Pa, Co, Ti, Al, Au, Lanthanoids such asLa, Er, and Yb, or combinations thereof. In various embodiments, thesilicide metal 57 is about 5 nm to about 50 nm thick. The silicide metal57 is deposited using a typical process such as sputter deposition. Invarious embodiments, after forming the doped semiconductor layer 55, thesilicide metal 57 is deposited without any intermediate annealing. Thisavoids diffusion of dopants from the doped semiconductor layer 55.

As next illustrated in FIG. 4e , the silicide metal 57 is annealed toform a metal silicide layer 59. Un-reacted silicide metal 57 is removedby an etching process. During the silicidation anneal, the silicidemetal 57 (FIG. 4d ) reacts with the doped semiconductor layer 55 andforms a metal silicide layer 59.

During silicidation, the dopant atoms within the doped semiconductorlayer 55 segregate out of and away from the silicide. Hence, theconcentration of the dopant atoms on the doped semiconductor layer 55 atthe interface between the growing silicide and the doped semiconductorlayer 55 increases during silicidation, forming a dopant rich region 56.The concentration of the dopant atoms in the dopant rich region 56 atthe interface between the metal silicide layer 59 and the remainingdoped semiconductor layer 55 is hence higher than the concentration ofthe dopant atoms on the as-deposited doped semiconductor layer 55 (shownin FIG. 4b ).

In alternative embodiments, all of the doped semiconductor layer 55 maybe consumed by the silicidation process, leaving only the dopant richregion 56 at the interface between the metal silicide layer 59 and thesemiconductor material 51. However, even if the silicide interface movesbeyond the doped semiconductor layer 55 and into the semiconductormaterial 51, the dopant rich region 56 is retained due to the favorablesegregation of dopants out of and away from the metal silicide layer 59.Further, the dopant segregation during silicidation follows the contourof the metal silicide layer 59 forming a dopant rich region 56self-aligned with the metal silicide layer 59. Further, in variousembodiments, the doped semiconductor layer 55 is doped in-situ such thatno implantation is required for doping the doped semiconductor layer 55,thereby resulting in a defect free silicide interface even with anon-planar structure.

FIGS. 5-8, 9 a, 10, and 11 a illustrate a non-planar transistor invarious stages of fabrication in accordance with embodiments of theinvention. FIGS. 9b and 11b illustrate the respective dopant profilesaround a silicide region during that stage of processing.

FIG. 5 illustrates a cross-sectional view of a non-planar transistorregion 101 of a substrate 20 after forming shallow trench isolationregions 22. The non-planar transistor region 101 may be a core circuitregion, for example, comprising the minimum length transistors in anembodiment. In other embodiments, the non-planar transistor region 101may include a plurality of different types and sizes of transistors.

The substrate 20 comprises bulk silicon in an embodiment. Alternatively,the substrate 20 comprises bulk silicon germanium (SiGe) or othersemiconductor materials. In various embodiments, the substrate 20 maycomprise an insulator, e.g., a silicon-on-insulator or agermanium-on-insulator. The substrate 20 may be doped with a p-type oran n-type impurity, depending on the types of the resulting transistor.

Referring to FIG. 5, isolation regions 22 are formed on the substrate20. As is known in the art, the isolation regions 22 may be formed byetching substrate 20 to form recesses, and then filling the recesseswith dielectric materials, such as high-density plasma (HDP) oxides,TEOS oxides, or the like. The width of the isolation regions 22 may beless than about 100 nm. One skilled in the art will realize, however,that the dimensions recited throughout the description are merelyexamples, and will change if different formation technologies and/ortechnology nodes are used.

FIG. 6, which includes 6 a and 6 b, illustrates the non-planartransistor region 101 after forming fins.

FIG. 6a is a cross-sectional view, while FIG. 6b is a perspective viewof the non-planar transistor region shown in FIG. 6a . Fins 28 may beformed by recessing the top surfaces of the isolation regions 22, andhence leaving the fins 28. Alternatively, the fins 28 are epitaxiallygrown from the semiconductor strips between the isolation regions 22. Inan embodiment, a height of the fins 28 above a top surface of theisolation regions 22 is between about 20 nm and about 100 nm, and aratio of height to width is between about 0.1 and about 10.

The fins 28 are implanted to uniformly dope the channel region of a MOStransistor that is being fabricated, in an embodiment. The channelregion of a MOS transistor is doped by a blanket implant, for example,using angled implants at multiple rotations. In an embodiment, if a NMOStransistor is to be formed, the fins 28 are implanted with a p-typedopant such as boron. In an alternative embodiment, if a PMOS transistoris to be formed, the fins 28 are implanted with an n-type dopant such asarsenic.

Referring to FIG. 7, a gate dielectric 40 and a gate electrode 42 aredeposited and patterned. FIG. 7c illustrates a perspective view of thenon-planar transistor region 101, while FIGS. 7a and 7b illustrate crosssectional views taken along the respective lines of FIG. 7c . FIG. 7aillustrates a cross sectional view showing the formation of the gatestack, while FIG. 7b illustrates a cross sectional view of thesource/drain region (to be formed) of the non-planar transistor.

The gate dielectric 40 may include commonly used dielectric materialssuch as oxides, nitrides, oxynitrides, high-K dielectrics such as Ta₂O₅,Al₂O₃, HfO, Ta₂O₅, SiTiO₃, HfSiO, HfSiON, ZrSiON, or combinationsthereof. The gate electrode layer 42 is formed on the gate dielectric40, and may be formed of polysilicon in an embodiment.

Alternatively, the gate electrode 42 may be formed of other commonlyused conductive materials, including metals such as Ni, Ti, Ta, Hf, orcombinations thereof, metal silicides such as NiSi, MoSi, HfSi, orcombinations thereof, and metal nitrides such as TiN, TaN, HfN, HfAlN,MoN, NiAlN, or combinations thereof. Next, gate spacers (not shown) areformed on the sidewalls of the gate dielectric 40 and the gate electrode42, while no gate spacers are formed on the sidewalls of the fins 28.

FIGS. 8-11 illustrate cross sectional views of the source/drain regionof the non-planar transistor.

Referring to FIG. 8, after forming source/drain regions 39, and a dopedsemiconductor layer 55 are formed. Suitable drain extension andsource/drain implants are performed into the fin 28 after formingspacers (as required) to form the source/drain regions 39. Subsequently,a selective epitaxial growth is used to form a doped semiconductor layer55.

The selective epitaxial growth process grows a layer of dopedsemiconductor material in both a top surface and a lateral surface ofthe fin 28. Depending on the underlying layer (for example, silicon(100) surface versus silicon (110) versus germanium (100), etc.) and thematerial being deposited, the doped semiconductor layer 55 may formfacets that may merge together or separate out. Preferably the lateraland vertical growth rates and the surface energies of the growingsurfaces are controlled such that a continuous layer is formed over theunderlying fin 28. A continuous layer will minimize variations betweenadjacent transistors. In various embodiments, the doped semiconductorlayer 55 comprises a doped silicon region, while in some embodiments,the doped semiconductor layer 55 comprises doped SiC, doped SiGe, ordoped Ge. In some embodiments, an intrinsic or lightly dopedsemiconductor layer may be first grown followed by a doped layer duringthis process.

FIG. 9, which includes FIGS. 9a and 9b , illustrates the semiconductordevice after depositing a silicide metal 57. The surface of the dopedsemiconductor layer 55 is cleaned to remove native oxide and othercontaminants that might exist prior to depositing the silicide metal 57.The cleaning process can comprise any suitable process, for example, awet clean or in-situ plasma treatment process.

Referring to FIG. 9a , a silicide metal 57 is deposited over the dopedsemiconductor layer 55. A one dimensional (1-D) doping profile of thedoping is illustrated in FIG. 9b which shows the dopant concentrationwith reference to the depth. The silicided metal 57 is deposited overthe doped semiconductor layer 55. In various embodiments, the silicidemetal 57 is deposited using any suitable method, such as sputtering,physical vapor deposition (PVD) techniques, and chemical vapordeposition (CVD) techniques.

The silicide metal 57 comprises a suitable metal, such as, for example,Ni, Co, Ta, Ti, W, Mo, Pd, Yb, Er, NiAl, Pt or an alloy of these metals.In an embodiment, the silicide metal 57 includes Ni or a Ni alloy. Invarious embodiments, the silicide metal 57 is selected based on theconductivity of the transistor being fabricated. The silicide metal 57is selected such that a silicide subsequently formed from the silicidemetal 57 lowers the Schottky barrier height of the majority carriers. Invarious embodiments, the silicide metal 57 for a PMOS transistorcomprises nickel, platinum, palladium, cobalt, or combinations thereof,and the like. In various embodiments, the silicide metal 57 for a NMOStransistor comprises nickel, aluminum, lanthanoids, or combinationsthereof, and the like. In an embodiment, the silicide metal 57 comprisesnickel doped with lanthanoids such as La, Er, Y, Yb, Dy, Gd, Ce, Tb, Pr,Er, or combinations thereof. The thickness of silicide metal 57 can beany suitable thickness, such as, for example, a thickness of about 20 nmor less. In an embodiment, the thickness of the silicide metal 57 isabout 5 nm to about 10 nm.

Referring to FIG. 9b , the dopant concentration is illustrated afterdepositing the silicide metal 57 over the fin 28. The as-depositeddoping profile D1 of the doped semiconductor layer 55 comprises auniform doping, although in some embodiments, a graded or a step likeconcentration may be used.

FIG. 10, illustrates the semiconductor device after annealing thesilicide metal 57 to form a metal silicide layer 59. During the silicideanneal, atoms from the silicide metal 57 diffuse into the dopedsemiconductor layer 55, and atoms from the doped semiconductor layer 55diffuse into the silicide metal 57. The intermixing of the two layersresults in the formation of a metal silicide layer 59. During theformation of the metal silicide layer 59, dopant atoms segregate awayfrom the metal silicide layer 59 into the doped semiconductor layer 55(also referred as “snow-plough” effect). Unlike dopant diffusion thatrequires a high annealing temperature, interfacial segregation duringsilicidation occurs at a much lower silicide anneal temperature.

In an embodiment, a first anneal at a first temperature is used to forma metal silicide comprising multiple phases. In an embodiment, the firsttemperature is about 280° C. to about 700° C. For example, after thefirst anneal, a plurality of silicides comprising MSi, MSi₂, and/or M₂Simay be formed. After removing any un-reacted metal silicide 57, a secondanneal is subsequently performed to homogenize the metal silicide. Forexample, after the second anneal a single phase comprising a monosilicide phase (MSi) is formed. Contacts (not shown) are subsequentlyformed on the metal silicide layer 59 and subsequent processingincluding metallization proceeds as in conventional processing.

FIG. 11, which includes FIGS. 11a-11c , illustrates the transistor 200after removing un-reacted silicide metal 57 (see FIG. 10). Theun-reacted silicide metal 57 is etched away after the silicide anneal.FIG. 11b compares a concentration of the dopant taken along the line 11b of FIG. 11a before and after the metal silicide anneal. Referring toFIG. 11b , as the dopant preferentially segregates out of the metalsilicide layer 59, the dopant concentration increases at the interfacebetween the doped semiconductor layer 55 and the metal silicide layer59. Hence, the resulting doping profile (D2) in the doped semiconductorlayer 55 is higher than a maximum concentration of the as-depositeddoping profile (D1). FIG. 11c illustrates a cross sectional view takenalong the line 11 c of FIG. 11a . Referring to FIG. 11c , thesource/drain region 39 are separated by a channel 11, and includes themetal silicide layer 59. The gate electrode 42, the gate dielectric 40,and the spacers 36 are illustrated as described during fabrication inprior Figures.

FIG. 12, which includes FIGS. 12a-12c , illustrates an alternativeembodiment of the fabrication process described in FIGS. 5-11. As inFIGS. 8-11, the cross sectional view of FIG. 12a corresponds to atransistor 100 taken along the line 7 b-7 b of FIG. 7c after subsequentprocessing. FIG. 12b illustrates a 1-D dopant profile after thesilicidation process, the cutline taken along the line 12 b-12 b of FIG.12a , and FIG. 12c is a cross sectional view taken along the line 12c-12 c of FIG. 12 a.

Unlike the prior embodiment, in this embodiment, the silicidationprocess forms the source/drain regions 39 of the transistor 100. Hence,unlike the prior embodiment, the source/drain implants are skipped andthe silicidation anneal is prolonged to form a thicker silicide region.Accordingly, the process proceeds as described in FIGS. 5-7 above exceptfor the changes as described herein. As described in FIG. 8, a dopedsemiconductor layer 55 (see FIG. 8) is formed. However, unlike FIG. 8,no source/drain implantation is performed before forming the dopedsemiconductor layer 55. Further, unlike the prior embodiment, drainextension implants are also avoided in this embodiment. Hence, hightemperature processing required for activating source/drain dopants maybe avoided, thus simplifying the manufacturing process. A silicide metal57 (see FIG. 9) is deposited as described with respect to FIG. 9 formingan as-deposited dopant profile D1 (as shown in FIG. 9b ). The thicknessof the silicide metal 57 can be any suitable thickness, such as, forexample, a thickness of about 100 nm or less. In an embodiment, thethickness of the silicide metal 57 is about 20 nm to about 50 nm.

As in prior embodiment (described in FIG. 10), the silicide metal 57 isannealed to form a metal silicide layer 59. However, unlike the priorembodiment, the silicide anneal time is longer, and the dopedsemiconductor layer 55 is completely consumed by the silicidation.Further, the silicidation converts a part of the fin 28 into the metalsilicide layer 59. Despite, the consumption of the doped semiconductorlayer 55, the interface between the metal silicide layer 59 and the fin28 includes a dopant rich region 56. The formation of the dopant richregion 56 is due to the preferential segregation of the dopant atoms outthe metal silicide layer 59 during silicidation (as described in FIG.9). This results in the formation of a dopant rich region 56 ahead ofthe moving silicide interface.

As illustrated in FIG. 12b , the dopant concentration increases at theinterface between the doped semiconductor layer 55 (see FIG. 11) and themetal silicide layer 59 while the doped semiconductor layer 55 isconsumed by the silicidation (as illustrated with reference to FIG. 11b). After the doped semiconductor layer 55 is consumed, the dopant atomsmigrate ahead and along with the moving silicide front forming a dynamicdoping profile D3 with a high dopant concentration. When thesilicidation is stopped, the dynamic doping profile D3 forms a regionwith high dopant concentration (dopant rich region 56). In variousembodiments, the dose of the dopant in the dopant rich region 56 isabout the same as the dose of the dopant in the as-deposited dopedsemiconductor layer 55 (dose of dopant profile D1).

Using this embodiment, a self-aligned silicide source/drain region withlow Schottky barrier is formed without any recessing of the fin 28.Optionally, in some embodiments, an additional recess may be formedwithin the fin 28 before forming the doped semiconductor layer 55 tominimize the silicide thickness. A cross sectional view of the resultingtransistor 100 is shown in FIG. 12c , which is a cross section alongline 12 c-12 c of FIG. 12a . The gate electrode 42, the gate dielectric40, and the spacers 36 are illustrated as described during fabricationin prior Figures (see FIG. 7).

While the embodiments described above in FIGS. 5-12 illustrated thefabrication of a device with two fins 28, in various embodiments, anyother suitable combination is possible. Similarly, other types ofdevices including gate all around devices and vertical transistors maybe fabricated using the embodiments described above. In an embodimentfor forming a gate all around device, after the formation of the gateelectrode 42 around the fin (using a suitable process), a portion of thefin for forming the source/drain regions is exposed. Process stepsillustrated in FIGS. 8-11, and/or 12 may be used to form a gate allaround transistor, for example, as shown in FIG. 3. In variousembodiments, contacts of other types of transistors including bipolarnon-planar transistors may be fabricated using the methods describedabove.

FIG. 13-16 illustrates a non-planar transistor during various stages ofmanufacturing using embodiments of the invention. The cross sectionalviews of FIGS. 13-16 correspond to subsequent processing of a transistor400 in a region as illustrated in the line 7 b-7 b of FIG. 7c . Unlikethe prior embodiment, in this embodiment, a doped semiconductor layerand a metal silicide are formed on a raised source/drain structure.

The processing proceeds as in the prior embodiment as described withrespect to FIGS. 5-7 forming a gate dielectric and a gate electrode (asshown in FIG. 7). Next, gate spacers (not shown) are formed on thesidewalls of the gate dielectric and the gate electrode, while no gatespacers are formed on the sidewalls of the fins 28. An extension implantmay optionally be performed to dope the exposed portions of the fins 28.The extension implant is a large angled low energy implant in anembodiment. The extension implant dopes the exposed portions of the fins28 with an n-type doping if a NMOS transistor is being formed, or ap-type doping if a PMOS transistor is being formed. An angled or tiltedhalo implant may be optionally performed as a sequence of multiplerotations. For example, a counter doping implant at an implant anglegreater than 45° with respect to the vertical axis and in rotations of45°, 135°, 225°, and 315° with respect to the gate electrode may beperformed in an embodiment.

Additional spacers may be formed after the extension implants.

Referring to FIG. 13, a selective epitaxial growth is performed to formsemiconductor material 51. The semiconductor material 51 forms thesource/drain regions 39 (raised source/drain) of the non-planartransistor 400. In an embodiment, the semiconductor material 51 isformed of the same material as the substrate 20, and is epitaxiallygrown on the fins 28. In alternative embodiments, semiconductor material51 is formed of a material different from that of substrate 20, forexample, silicon germanium (SiGe), silicon carbon (SiC), etc. Being aselective epitaxial deposition process, the semiconductor material 51does not grow on the gate dielectric and the gate electrode (gateelectrode and gate dielectric illustrated in FIG. 7).

The epitaxial growth includes vertical growth and horizontal growth.Hence, if the transistor being formed comprises multiple fins (fingeredtransistors), the portion of semiconductor material 51 grown from one ofthe fins 28 eventually joins the portion of semiconductor material 51grown from a neighboring fin 28. As shown in FIG. 13, the epitaxiallygrown semiconductor material 51 forms a continuous region.Alternatively, the separation between adjacent fins 28 may be large suchthat the semiconductor material 51 does not form a continuous layer.Rather, in such embodiments, each fin 28 forms a separate raisedsource/drain region comprising the semiconductor material 51.

During the growth of semiconductor material 51, a p-type impurity or ann-type impurity may be in-situ doped, and hence the resultingsemiconductor material 51 may be of p-type or n-type. The impurityconcentration of the semiconductor material 51 may be between about1×10¹⁷/cm³ to about 5×10²⁰/cm³.

While the semiconductor material 51 may be pre-doped in someembodiments, the semiconductor material 51 may be further doped byimplantation. In various embodiments, the implants may be angled and maycomprise multiple rotations. In an embodiment, if a PMOS transistor isto be formed in the non-planar transistor region 101, the correspondingNMOS transistor regions are masked, and a p-type impurity is implantedinto the PMOS transistor region. Alternatively, if a NMOS transistor isto be formed in the non-planar transistor region 101, the correspondingPMOS transistor regions are masked, and an n-type impurity is implantedinto the NMOS transistor region. A spike anneal or a micro second annealmay be used to activate the implanted dopants, thus forming source/drainregions 39.

Referring to FIG. 14, after forming suitable spacers, a selectiveepitaxial growth is used to form a doped semiconductor layer 55. In someembodiments, if no source/drain implantation is required, a singleepitaxial process may be used to deposit the semiconductor material 51and the doped semiconductor layer 55. The selective epitaxial growthprocess grows a layer of doped semiconductor material in both a topsurface and a lateral surface of the source/drain regions 39. Dependingon the underlying layer (for example, semiconductor material 51) and thematerial being deposited, the doped semiconductor layer 55 may growforming facets that may merge together or separate out. The differentsurface being on different crystal planes may have different growthrates. The lateral and vertical growth rates and the surface energies ofthe growing surfaces are controlled such that a continuous layer isformed over the underlying semiconductor material 51. A continuous layerwill minimize variations in sheet resistance in the subsequently formedsilicide layer. In various embodiments, the doped semiconductor layer 55comprises a doped silicon region, while in some embodiments, the dopedsemiconductor layer 55 comprises doped SiC, doped SiGe, or doped Ge.

FIG. 15 illustrates the semiconductor device after depositing a silicidemetal 57. The surface of the doped semiconductor layer 55 is cleaned toremove native oxide and other contaminants that might exist prior todepositing the silicide metal 57. The cleaning process can comprise anysuitable process, for example, a wet clean or in-situ plasma treatmentprocess. As in the prior embodiment, a silicide metal 57 is depositedover the doped semiconductor layer 55. In various embodiments, thesilicide metal 57 is deposited using any suitable method, such assputtering, physical vapor deposition (PVD) techniques, and chemicalvapor deposition (CVD) techniques.

The silicide metal 57 comprises a suitable metal, such as, for example,Ni, Co, Ta, Ti, W, Mo, Pd, NiAl, Pt, Lanthanoids, or an alloy of thesemetals. In various embodiments, the silicide metal 57 for a PMOStransistor comprises nickel, platinum, palladium, cobalt, orcombinations thereof, and the like. In various embodiments, the silicidemetal 57 for a NMOS transistor comprises nickel, aluminum, lanthanoids,or combinations thereof, and the like. In an embodiment, the silicidemetal 57 comprises nickel doped with lanthanoids such as La, Er, Y, Yb,Dy, Gd, Ce, Tb, Pr and/or Er. The thickness of silicide metal 57 can beany suitable thickness, such as, for example, a thickness of about 20 nmor less. In an embodiment, the thickness ranges from about 5 nm to about10 nm.

FIG. 16 illustrates the semiconductor device after annealing thesilicide metal to form the metal silicide layer 59. Any un-reactedsilicide metal 57 is etched and removed after the silicide anneal. FIG.16 also illustrates the dopant rich region 56 formed within theremaining doped semiconductor layer 55. In various embodiments, all ofthe doped semiconductor layer 55 may be consumed by the silicidation,leaving only the dopant rich region 56. Subsequent processing includingmetallization proceeds as in conventional processing.

While the embodiment described above in FIGS. 13-16 illustrated thefabrication of a device with at least two fins 28, in variousembodiments, any other suitable combination is possible. For example, ifthe method described in FIG. 13-16 is used in fabrication of a devicewith a single fin, the device corresponding to the embodiment describedin FIG. 2 may be formed. Similarly, other types of devices includinggate all around devices and vertical transistors may be fabricated usingthe embodiments described above. In various embodiments, contacts ofother types of transistors including bipolar non-planar transistors maybe fabricated using the methods described above.

Embodiments of the invention include non-planar transistors and methodsof fabrication thereof. In accordance with an embodiment of the presentinvention, a method of forming a non-planar transistor includes forminga channel region on a first portion of a semiconductor fin, thesemiconductor fin comprising a top surface and sidewalls, and forming agate electrode over the channel region of the semiconductor fin. Themethod further comprises growing an in-situ doped semiconductor layer onthe top surface and the sidewalls of the semiconductor fin on opposingsides of the gate electrode using a selective epitaxial growth process.At least a part of the doped semiconductor layer is converted into adopant rich region.

The foregoing has outlined rather broadly the features of an embodimentof the present invention in order that the detailed description of theinvention that follows may be better understood. Additional features andadvantages of embodiments of the invention will be describedhereinafter, which form the subject of the claims of the invention. Itshould be appreciated by those skilled in the art that the conceptionand specific embodiments disclosed may be readily utilized as a basisfor modifying or designing other structures or processes for carryingout the same purposes of the present invention. It should also berealized by those skilled in the art that such equivalent constructionsdo not depart from the spirit and scope of the invention as set forth inthe appended claims.

Although the present invention and its advantages have been described indetail, it should be understood that various changes, substitutions andalterations can be made herein without departing from the spirit andscope of the invention as defined by the appended claims. For example,it will be readily understood by those skilled in the art that many ofthe features, functions, processes, and materials described herein maybe varied while remaining within the scope of the present invention.

Moreover, the scope of the present application is not intended to belimited to the particular embodiments of the process, machine,manufacture, composition of matter, means, methods and steps describedin the specification. As one of ordinary skill in the art will readilyappreciate from the disclosure of the present invention, processes,machines, manufacture, compositions of matter, means, methods, or steps,presently existing or later to be developed, that perform substantiallythe same function or achieve substantially the same result as thecorresponding embodiments described herein may be utilized according tothe present invention. Accordingly, the appended claims are intended toinclude within their scope such processes, machines, manufacture,compositions of matter, means, methods, or steps.

What is claimed is:
 1. A non-planar transistor comprising: a fincomprising a top surface and sidewalls, the fin comprising a firstportion, a second portion, and a third portion disposed between thefirst and the second portion, the first portion comprising a firstsource/drain region, the second portion comprising a second source/drainregion, the third portion comprising a channel region; an epitaxialsemiconductor layer on the top surface and sidewalls of the fin onopposing sides of the third portion, the epitaxial semiconductor layerhaving a first doping profile; a dopant rich semiconductor layer havinga second doping profile disposed over the epitaxial semiconductor layer,the dopant rich semiconductor layer comprising a first conductivitytype, the first doping profile different than the second doping profile,the dopant rich semiconductor layer disposed over the first portion andthe second portion; the channel region comprising a second conductivitytype opposite the first conductivity type; and a silicide layer disposedon a top surface and sidewalls of the dopant rich semiconductor layer,wherein the silicide layer is adjacent to the dopant rich semiconductorlayer.
 2. The non-planar transistor of claim 1, wherein the channelregion physically contacts the dopant rich semiconductor layer.
 3. Thenon-planar transistor of claim 2, wherein the silicide layer is incontact with a source/drain region of the non-planar transistor, whereinan interface between the silicide layer and the dopant richsemiconductor layer comprises a Schottky barrier, and wherein aconcentration of a dopant in the dopant rich semiconductor layer at aninterface between the silicide layer and the dopant rich semiconductorlayer is higher than a concentration of the dopant in the silicide layerat the interface.
 4. The non-planar transistor of claim 3, wherein aconcentration of a dopant in the dopant rich semiconductor layer at aninterface between the silicide layer and the dopant rich semiconductorlayer is greater than about 10¹⁹ cm⁻³, wherein a Schottky barrier heightfor a majority charge carrier of the non-planar transistor at theinterface between the silicide layer and dopant rich semiconductor layeris less than about 0.2 eV, wherein a thickness of the dopant richsemiconductor layer is less than about 10 nm.
 5. The non-planartransistor of claim 1, further comprising a gate electrode disposed overthe channel region and a portion of the dopant rich semiconductor layer.6. The non-planar transistor of claim 1, wherein the silicide layercomprises a metal selected from a group consisting of Ni, Al, La, Er, Y,Yb, Dy, Gd, Ce, Tb, Pr, Er, Co, Pt, Pd and combinations thereof.
 7. Thenon-planar transistor of claim 1, wherein the dopant rich semiconductorlayer and silicide layer extend under the fin opposite the top surfaceof the fin.
 8. A device comprising: a channel region on a first portionof a semiconductor fin, the semiconductor fin comprising a top surfaceand sidewalls; a gate electrode over the channel region of thesemiconductor fin; an epitaxial layer on the top surface and sidewallsof the semiconductor fin on opposing sides of the channel region, theepitaxial layer having a first doping profile and a first dopingconcentration; a doped semiconductor layer of a first material disposedover the epitaxial layer and having a second doping profile and a seconddoping concentration, wherein at least one of: the first doping profileis different than the second doping profile; or the first dopingconcentration is different than the second doping concentration; asilicide layer contacting the doped semiconductor layer, the silicidelayer comprising a silicide metal and the first material; and a dopantrich region disposed in the doped semiconductor layer and abutting thesilicide layer, the dopant rich region disposed on first and secondsource/drain regions, the channel region interposed between the firstand second source/drain regions.
 9. The device of claim 8, wherein thedoped semiconductor layer has a doping profile outside of the dopantrich region that is different from the doping profile within the dopantrich region.
 10. The device of claim 9, wherein the dopant rich regionhas a dynamic doping profile.
 11. The device of claim 8, wherein atleast a portion of the dopant rich region is disposed under the gateelectrode.
 12. The device of claim 8, wherein an interface between thesilicide layer and the dopant rich region forms a Schottky barrier. 13.The device of claim 8, wherein the first and second source/drain regionsare in the semiconductor fin.
 14. The device of claim 8, wherein thesilicide layer comprises a metal selected from a group consisting of Ni,Al, La, Er, Y, Yb, Dy, Gd, Ce, Tb, Pr, Er, Co, Pd, Pt and combinationsthereof, and wherein the device comprises a double gate, a triple gate,or a gate all around transistor.
 15. A device comprising: a channelregion on a first portion of a semiconductor fin, the semiconductor fincomprising a top surface and sidewalls, the semiconductor fin having asecond portion comprising a first source/drain region, the semiconductorfin having a third portion comprising a second source/drain region, thefirst portion interposed between the second portion and the thirdportion; a gate electrode over the channel region of the semiconductorfin; an epitaxial semiconductor layer on the top surface and thesidewalls of a portion of the semiconductor fin on opposing sides of thegate electrode, the epitaxial semiconductor layer having a first dopingprofile; a second semiconductor layer having a second doping profileover the epitaxial semiconductor layer, the first doping profiledifferent than the second doping profile; a silicide layer over thesecond semiconductor layer; and a dopant rich layer having a uniformthickness disposed in the second semiconductor layer, the dopant richlayer adjacent to the silicide layer, the dopant rich layer disposed onthe second and the third portions.
 16. The device of claim 15, whereinan interface between the silicide layer and the dopant rich layer formsa Schottky barrier.
 17. The device of claim 16, wherein a concentrationof a dopant in the dopant rich layer at an interface between thesilicide layer and the dopant rich layer is greater than about 10 ¹⁹cm⁻³, wherein a Schottky barrier height for a majority charge carrier ofthe device at the interface between the silicide layer and dopant richlayer is less than about 0.2 eV, wherein a thickness of the dopant richlayer is less than about 10 nm.
 18. The device of claim 15, wherein atleast a portion of the dopant rich layer is disposed under the gateelectrode.
 19. The device of claim 15, wherein the silicide layercomprises a metal selected from a group consisting of Ni, Al, La, Er, Y,Yb, Dy, Gd, Ce, Tb, Pr, Er, NiSi₂Al_(x) and combinations thereof, andwherein the device comprises an NMOS transistor.
 20. The device of claim15, wherein the dopant rich layer has a dynamic doping profile.